Team:ArtScienceBangalore/Notebook/Atomic Force microscope

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The Atomic Force Microscope

  • Different from the other microscopes because it doesn't use a lens for imaging. Rather, it uses a cantilever that is can detect up to a nanometer deflection in the surface texture of the object under scan.
  • The deflection is measured using a laser spot reflected of the top of the cantilever.

File:Atomic.jpg

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