"
Team:ArtScienceBangalore/Notebook/Atomic Force microscope
From 2009.igem.org
The Atomic Force Microscope
- Different from the other microscopes because it doesn't use a lens for imaging. Rather, it uses a cantilever that is can detect up to a nanometer deflection in the surface texture of the object under scan.
- The deflection is measured using a laser spot reflected of the top of the cantilever.
